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Reliability of 1310 nm Wafer Fused VCSELs

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7 Author(s)
Sirbu, A. ; Laboratory of Physics of Nanostructures, Ecole Polytechnique Fédérale de Lausanne, Lausanne, Switzerland ; Suruceanu, G. ; Iakovlev, V. ; Mereuta, A.
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Wafer fusion vertical cavity surface emitting laser (VCSEL) technology has produced devices that successfully passed all mechanical and electrical Telcordia qualification tests. Accelerated lifetime tests result in times to 1% failure at 70$^{circ}{rm C}$ of 18 years and 30 years at VCSEL driving currents of 9 and 8 mA, respectively. These lifetimes meet the telecom industry reliability requirements for applications in fiber-optic communications networks.

Published in:

Photonics Technology Letters, IEEE  (Volume:25 ,  Issue: 16 )