Cart (Loading....) | Create Account
Close category search window
 

Testing Chips With Spare Identical Cores

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ramdas, A. ; Dept. of Electr. & Comput. Eng., Polytech. Inst. of New York Univ., Brooklyn, OH, USA ; Sinanoglu, O.

Scalability, power efficiency, and shorter time to market due to design reuse have favored the adoption of homogeneous multicore chips with identical processing units (cores) integrated together, offering enhanced computational power. Furthermore, chips with identical cores help cope with increasing defect rates in delivering reasonable yield levels via the utilization of spare cores. In this paper, we propose a comparison-based test access mechanism (TAM) that is capable of handling spare identical cores. The proposed TAM guarantees the test of a chip through minimum bandwidth in minimum test time, while ensuring zero yield loss in the presence of spare identical cores, as its design is driven by the number of spare cores on the chip. The proposed solution also enables the identification of all the good cores in usable chips, supporting models where chips are priced based on the number of good cores. Furthermore, we provide a tradeoff analysis that enables the designers to make an informed decision regarding yield loss versus area cost. We also extend the proposed TAM by adding efficient diagnostic features, and adapting it for low-power test.

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:32 ,  Issue: 7 )

Date of Publication:

July 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.