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This study presents a 1-5.6 Gb/s CMOS clock and data recovery (CDR) integrated circuit (IC) implemented in a 0.13 μm CMOS process. The CDR uses a half-rate linear phase detector (PD) of which static phase offset is compensated by an additional binary PD and a digital charge pump (CP) calibration block. During initialisation, the static phase offset is detected by the binary PD and the CP current is controlled accordingly to compensate the static phase offset. Also, the architecture of this CDR IC is designed for a clock embedded serial data interface which transfers CDR training clock patterns before normal random data signals. The implemented IC consumes 16-22 mA from a 1.2 V core supply for data rates of 1-5.6 Gb/s and 20 mA from a 3.3 V I/O supply for two preamplifiers and low-voltage differential signalling drivers. When the 231-1 pseudorandom binary sequence is used, the measured bit-error rate is better than 10-12 and the jitter tolerance is 0.3UIpp. The recovered clock jitter is 21.6 and 4.2 psrms for 1 and 5.6 Gb/s data rates, respectively.