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Single Event Transients in Digital CMOS—A Review

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3 Author(s)
Ferlet-Cavrois, V. ; Eur. Space Agency, Noordwijk, Netherlands ; Massengill, L.W. ; Gouker, P.

The creation of soft errors due to the propagation of single event transients (SETs) is a significant reliability challenge in modern CMOS logic. SET concerns continue to be exacerbated by Moore's Law technology scaling. This paper presents a review of digital single event transient research, including: a brief historical overview of the emergence of SET phenomena, a review of the present understanding of SET mechanisms, a review of the state-of-the-art in SET testing and modelling, a discussion of mitigation techniques, and a discussion of the impact of technology scaling trends on future SET significance.

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Nuclear Science, IEEE Transactions on  (Volume:60 ,  Issue: 3 )