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Built-in self-test (BIST) is emerging as an important option for testing VLSI application-specific integrated circuits (ASICs). The advantages of BIST are reviewed in relation to the particular test requirements imposed by ASICs. A suite of programs are described that facilitate the incorporation of BIST into ASIC designs. The programs comprise a high-level planning tool, operating from functional descriptions of the circuit. A set of programs is also described that enables the evaluation of the fault coverage achieved when circuits are tested using pseudo-random patterns, and also aid the placement of additional test hardware to improve the level of fault coverage.
Computers and Digital Techniques, IEE Proceedings E (Volume:135 , Issue: 4 )
Date of Publication: 7-11 Sep 1987