Cart (Loading....) | Create Account
Close category search window
 

Design and Analysis of a Slider-Level Piezoelectric Sensor Array for Head-Disk Contact Detection

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Yuan, Y. ; Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore, Singapore ; Du, H. ; Chow, K.S. ; Zhang, M.
more authors

To realize higher areal densities towards 10 Tbit/in2, the ever decreasing flying height of the slider approaches the near-contact regime. It is essential to monitor head-disk interactions to prevent instability and damage to the head-disk interface. In this study, a piezoelectric sensor array embedded on the slider was proposed for head-disk contact detection. Integrability of the sensor array with standard slider fabrication process was considered in the design. Dynamic response of the sensor array to typical contact scenarios was obtained by finite element analysis. Simulation results suggest that the sensor array is adequately sensitive and capable of identifying contact location under intermittent head-disk contact.

Published in:

Magnetics, IEEE Transactions on  (Volume:49 ,  Issue: 6 )

Date of Publication:

June 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.