Cart (Loading....) | Create Account
Close category search window
 

Results of the TanDEM-X Baseline Calibration

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Antony, J.W. ; Microwaves & Radar Inst., German Aerosp. Center (DLR), Wessling, Germany ; Gonzalez, J.H. ; Schwerdt, M. ; Bachmann, M.
more authors

The TanDEM-X mission based on two satellites provides a radar interferometer in space with the goal to derive a global Digital Elevation Model (DEM) with never achieved quality for a global coverage: a global DEM with a relative height accuracy of 2 m and 10 m absolute. In order to achieve this mission goal, the radial and cross-track distance between both satellites, the so called baseline has to be known with high accuracy. Only then, systematic baseline errors can be detected and compensated for, i.e., an accurate calibration of the global DEM can be ensured. The paper describes the procedure and the results of calibrating the baseline, verifying the outstanding accuracy of this calibration procedure.

Published in:

Selected Topics in Applied Earth Observations and Remote Sensing, IEEE Journal of  (Volume:6 ,  Issue: 3 )

Date of Publication:

June 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.