Close category search window
 

Second-order signal analysis on the direct-current amplitude-modulation of semiconductor lasers with effects of hot carriers and hot phonons

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

6 Author(s)
Wu, Tsu-Yin ; Dept. of Electron. & Electr. Eng., De Montfort Univ., Leicester, UK ; Shih, Fang-Ping ; Sung, Tien-Li ; Chih-Hsiung Chen
more authors

In this work, to characterise the effect of hot carriers, our theoretical model comprises rate equations of carrier-photon interaction including the energy-transfer processes among carriers, photons, and phonons in a semiconductor laser. We theoretically investigate the effect of hot carriers on the second-order harmonic distortion in semiconductor lasers. Compared to other theoretical models, our model comprises the degenerate carrier energy distribution and incorporates the effects of stimulated and nonstimulated (i.e., Auger) recombination heating. These are the major heating mechanisms in semiconductor lasers as well as the injection heating and free carrier absorption heating

Published in:
High Frequency Postgraduate Student Colloquium, 1997

Date of Conference: 19 Sep 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.