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The use of composite materials for electromagnetic shielding applications contributes to the effort of structure lightening in aerospace industry. In these materials the strong interaction between the electromagnetic field and the microstructure makes the standard numerical tools difficult to implement. Indeed these methods would involve an excessive number of degrees of freedom to describe details of the microstructure. An efficient way to overcome this problem is the use of homogenization techniques providing the effective properties of heterogeneous materials. These effective properties can then be introduced in standard numerical tools to estimate the behavior of shielding enclosures. A recent paper proposes an extension to microwave frequencies of quasistatic homogenization methods. It introduces a characteristic length for the microstructure in the case of a square array of circular 2-D conductive phases embedded in a dielectric matrix. In this paper, a method to identify this length parameter is proposed for random microstructures.