Cart (Loading....) | Create Account
Close category search window

Effect of Input Noise and Output Node Stochastic on Wang's k WTA

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Sum, J. ; Inst. of Technol. Manage., Nat. Chung Hsing Univ., Taichung, Taiwan ; Chi-Sing Leung ; Ho, K.

Recently, an analog neural network model, namely Wang's kWTA, was proposed. In this model, the output nodes are defined as the Heaviside function. Subsequently, its finite time convergence property and the exact convergence time are analyzed. However, the discovered characteristics of this model are based on the assumption that there are no physical defects during the operation. In this brief, we analyze the convergence behavior of the Wang's kWTA model when defects exist during the operation. Two defect conditions are considered. The first one is that there is input noise. The second one is that there is stochastic behavior in the output nodes. The convergence of the Wang's kWTA under these two defects is analyzed and the corresponding energy function is revealed.

Published in:

Neural Networks and Learning Systems, IEEE Transactions on  (Volume:24 ,  Issue: 9 )

Date of Publication:

Sept. 2013

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.