Cart (Loading....) | Create Account
Close category search window

Electrical and optical characterization of the metal-insulator transition temperature in Cr-doped VO2 thin films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

9 Author(s)
Brown, B.L. ; Department of Physics, University of Texas at Dallas, Richardson, Texas 75080, USA ; Lee, Mark ; Clem, P.G. ; Nordquist, C.D.
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The effect of Cr doping on electrical and optical properties of CrxV1-xO2 thin films across the metal-insulator transition has been studied. Resistance, Hall effect, and infrared reflectance show that Cr doping systematically increases the transition temperature Tc from 59 °C at x = 0 to 70 °C at x = 0.11 with similar transition width and hysteresis from DC to infrared, but the effect appears to saturate. The conductance contrast between insulating and metallic phases decreases with Cr doping. The effects of carrier density and mobility changes across Tc will be discussed.

Published in:

Journal of Applied Physics  (Volume:113 ,  Issue: 17 )

Date of Publication:

May 2013

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.