By Topic

Harmonic Load-Pull Techniques: An Overview of Modern Systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ferrero, A. ; Electron. & Telecommun. Dept., Politec. di Torino, Turin, Italy ; Pirola, M.

The characterization of microwave devices under nonlinear conditions is fundamental for device technology development, to improve device large signal model accuracy and reliability, as well as an essential tool to support the design of power amplifiers (PAs). Since the input and output device terminations at fundamental and harmonics frequencies play a crucial role to set the device behaviors and performances, load-pull (LP) measurements are today one of the prominent characterization solutions at RF, micro-, and millimeter waves. In this article, a concise but comprehensive overview of the most important LP techniques available today is presented and pros and cons of the several approaches are highlighted and discussed.

Published in:

Microwave Magazine, IEEE  (Volume:14 ,  Issue: 4 )