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Pulsed-Laser Testing for Single-Event Effects Investigations

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4 Author(s)
Stephen P. Buchner ; Naval Research Laboratory, Washington, DC, USA ; Florent Miller ; Vincent Pouget ; Dale P. McMorrow

The application of pulsed lasers to the study of Single-Event Effects (SEEs) in integrated circuits and devices is described. The role of a pulsed laser is to provide spatial and temporal information about SEEs, information that is not available when broad-beam ion sources are used. A detailed description is given of the mechanisms involved, including light propagation and absorption by both linear and non-linear processes. Numerous examples highlight the versatility and usefulness of the technique in the study of SEEs.

Published in:

IEEE Transactions on Nuclear Science  (Volume:60 ,  Issue: 3 )