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A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter

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3 Author(s)
Schoukens, Johan ; Dept. of Electr. Meas., Vrije Univ., Brussels, Belgium ; Pintelon, R. ; Vandersteen, Gerd

A method is proposed to characterize the nonideal behavior of a data acquisition channel using a sinewave fitting procedure. Three error sources are considered: the nonlinear (dynamic) behavior of the data acquisition channel (amplifiers, sample-and-hold, analog-digital convertor); the time base distortion; and the time jitter. These errors are quantified starting from a series of repeated sinewave measurements

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Instrumentation and Measurement, IEEE Transactions on  (Volume:46 ,  Issue: 4 )