By Topic

A sinewave fitting procedure for characterizing data acquisition channels in the presence of time base distortion and time jitter

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
J. Schoukens ; Dept. of Electr. Meas., Vrije Univ., Brussels, Belgium ; R. Pintelon ; G. Vandersteen

A method is proposed to characterize the nonideal behavior of a data acquisition channel using a sinewave fitting procedure. Three error sources are considered: the nonlinear (dynamic) behavior of the data acquisition channel (amplifiers, sample-and-hold, analog-digital convertor); the time base distortion; and the time jitter. These errors are quantified starting from a series of repeated sinewave measurements

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:46 ,  Issue: 4 )