Cart (Loading....) | Create Account
Close category search window

Dipulse-response measurement of a magnetic recording channel using Golay complementary sequences

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Braun, V. ; Digital Commun. Group, Essen Univ., Germany

We apply Golay complementary sequences for measuring the dipulse response and transfer functions of a digital magnetic-saturation-recording channel. Our experimental channel suffers from nonlinear distortion caused by a magnetoresistive (MR) sensor. The measured-channel characteristics are compared with the same characteristics obtained by the dipulse-response measurement technique by using feedback-shift register sequences. Based on a practical nonlinear Volterra model of a digital magnetic-saturation-recording channel, we analyze the artifacts caused by second- and third-order nonlinear distortion, which do-occur in the Golay dipulse responses and transfer functions. We show that with either of the considered dipulse-response measurement techniques, the artifacts caused by even-order nonlinear distortion, which occur in the measured-channel characteristics, can easily be removed. The measured-channel characteristics obtained show excellent performance for either of the considered excitation sequences

Published in:

Magnetics, IEEE Transactions on  (Volume:34 ,  Issue: 1 )

Date of Publication:

Jan 1998

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.