Cart (Loading....) | Create Account
Close category search window
 

Processes in construction of failure management expert systems from device design information

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Malin, J.T. ; Lyndon B. Johnson Space Center, NASA, Houston, TX, USA ; Lance, N.

The tasks and problem-solving methods used by an engineer in constructing a failure-management expert system from design information about the device to be diagnosed are analyzed. An expert test engineer developed a troubleshooting expert system based on device design information and experience with similar devices, rather than on specific expert knowledge gained from operating the device or troubleshooting its failures. The construction of the expert system was intensively observed and analyzed. The authors characterize the knowledge, tasks, methods, and design decisions involved in constructing this type of expert system, and make recommendations concerning tools for aiding and automating construction of such systems.

Published in:

Systems, Man and Cybernetics, IEEE Transactions on  (Volume:17 ,  Issue: 6 )

Date of Publication:

Nov.-Dec. 1987

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.