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Anomalous second breakdown failure levels in Germanium gold-bonded diodes

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2 Author(s)
Norman S. Cohn ; Naval Ordnance Lab., White Oak, Silver Spring, MD, USA ; Marcella C. Petree

Pulse injection tests on germanium gold-bonded diodes showed that failure due to second breakdown may occur at lower power levels in the forward direction than in the reverse direction. The result is shown to be due to the hemispherical geometry of the junction and the associated spatial variation of the conductivity modulation. Variation between devices of different manufacturers is noted.

Published in:

IEEE Transactions on Nuclear Science  (Volume:21 ,  Issue: 4 )