By Topic

Fabrication and characterization of giant magnetoresistive elements with an integrated test coil

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Kools, J.C.S. ; Philips Res. Lab., Eindhoven, Netherlands ; Ruigrok, J.J.M. ; Postma, B. ; De Nooijer, M.C.
more authors

Magnetoresistive elements (MREs) containing exchange-biased spin valve multilayers as the magnetoresistive material have been fabricated. Their electrical response has been measured using an integrated test coil. Both parallel and crossed arrangements of the easy axes of the free and biased layers have been studied. Output voltage levels of these elements in response to an ac magnetic field are typically a factor of 7-10 higher than those obtained in similar elements based on a conventional, 30 nm thick anisotropic magnetoresistive (AMR) Ni80 Fe20 film linearized by the “barber-pole” method. The parallel arrangement is found to result in a switching behavior which is characteristic of domain wall movement and contains hysteresis, Barkhausen noise, and strong harmonic distortion. The arrangement with crossed anisotropies is found to display a behavior characteristic of switching by magnetization rotation as evidenced by a strong reduction of hysteresis, Barkhausen noise, and harmonic distortion. Demagnetization effects are calculated in order to quantitatively explain the shape of the response curve and the difference in output voltage when compared to AMR-based MREs

Published in:

Magnetics, IEEE Transactions on  (Volume:33 ,  Issue: 6 )