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Modeling of Electrostatic QCA Wires

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1 Author(s)
Timothy J. Dysart ; Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN, USA

This paper presents a yield analysis of molecular scale electrostatic QCA wires in the presence of a variety of manufacturing defects. Within this analysis, we compare wires of varying lengths and widths as thicker wires are frequently projected to be more tolerant to manufacturing defects. Additionally, we compare the simulation results of long wires to the yield rates predicted via probabilistic transfer matrix (PTM) modeling. This comparison demonstrates that PTM modeling is best used when the short wire segments used to estimate the yields of long wires have high yields.

Published in:

IEEE Transactions on Nanotechnology  (Volume:12 ,  Issue: 4 )