By Topic

Polynomial Test for Stochastic Diagnosability of Discrete-Event Systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Jun Chen ; Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA ; Kumar, R.

Two types of diagnosability of stochastic discrete-event systems (DESs) were introduced by Thorsley in 2005, where a necessary and sufficient condition for Strong Stochastic (SS)-Diagnosability (referred as A-diagnosability by Thorsley and Teneketzis, 2005), and a sufficient condition for Stochastic (S)-Diagnosability (referred as AA-diagnosability by Thorsley and Teneketzis, 2005), both with exponential complexity, were reported. In this paper, we present polynomial complexity tests for checking: (i) necessity and sufficiency of SS-Diagnosability; (ii) sufficiency of S-Diagnosability; and (iii) sufficiency as well as necessity of S-Diagnosability; the latter requires an additional notion of probabilistic equivalence. Thus, the work presented improves the accuracy as well as the complexity of verifying stochastic diagnosability.

Published in:

Automation Science and Engineering, IEEE Transactions on  (Volume:10 ,  Issue: 4 )