By Topic

Whitening SOA Testing via Event Exposure

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Chunyang Ye ; University of Toronto, Toronto ; Hans-Arno Jacobsen

Whitening the testing of service-oriented applications can provide service consumers confidence on how well an application has been tested. However, to protect business interests of service providers and to prevent information leakage, the implementation details of services are usually invisible to service consumers. This makes it challenging to determine the test coverage of a service composition as a whole and design test cases effectively. To address this problem, we propose an approach to whiten the testing of service compositions based on events exposed by services. By deriving event interfaces to explore only necessary test coverage information from service implementations, our approach allows service consumers to determine test coverage based on selected events exposed by services at runtime without releasing the service implementation details. We also develop an approach to design test cases effectively based on event interfaces concerning both effectiveness and information leakage. The experimental results show that our approach outperforms existing testing approaches for service compositions with up to 49 percent more test coverage and an up to 24 percent higher fault-detection rate. Moreover, our solution can trade off effectiveness, efficiency, and information leakage for test case generation.

Published in:

IEEE Transactions on Software Engineering  (Volume:39 ,  Issue: 10 )