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Voltage Dependency of Propagating Single-Event Transient Pulsewidths in 90-nm CMOS Technology

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9 Author(s)
Junrui Qin ; Sch. of Comput. Sci., Nat. Univ. of Defense Technol., Changsha, China ; Shuming Chen ; Bin Liang ; Zhen Ge
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This paper reports on the supply voltage dependency of single-event transient (SET) propagation and multinode charge collection phenomena in integrated circuits. We have found that the SET pulsewidth propagating to subsequent stages in a circuit may decrease with reduced power supply voltage, which runs counter to the general conclusion that ultralow power applications are much more susceptible to disruption from a particle strike. This effect provides the circuit designers a guidance to reconsider the impact of voltage on SET pulsewidth.

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Device and Materials Reliability, IEEE Transactions on  (Volume:14 ,  Issue: 1 )