Cart (Loading....) | Create Account
Close category search window
 

Automatic test sequences generation for SSCOP protocol

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Boo Ho Lee ; Electron. & Telecommun. Res. Inst., Daejeon, South Korea ; Byoung Moon Chin

This paper presents some considerations for the simulation of real protocol, SSCOP(Service Specific Connection Oriented Protocol), in the viewpoint of test sequence generation, not of implementation. For the automatic generation of test sequences, we need information for the state transitions of the system to be tested with as high coverage as possible. The information can be obtained during the simulation of the protocol. In the case, the final goal of such a simulation is to achieve 100 percent of coverage for all the possible transitions of the protocol. To obtain a good coverage during the simulation, we modified the SDL model of the protocol. By applying the test sequence generation algorithm for the state transition graph obtained after the simulation of the system, we have generated optimized test sequences for the SSCOP

Published in:

Information Networking, 1998. (ICOIN-12) Proceedings., Twelfth International Conference on

Date of Conference:

21-23 Jan 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.