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Semianalytical Model of the Subthreshold Current in Short-Channel Junctionless Symmetric Double-Gate Field-Effect Transistors

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4 Author(s)
Gnudi, A. ; Adv. Res. Center for Electron. Syst., Univ. of Bologna, Bologna, Italy ; Reggiani, S. ; Gnani, E. ; Baccarani, G.

A 2-D semianalytical solution for the electrostatic potential valid for junctionless symmetric double-gate field-effect transistors in subthreshold regime is proposed, which is based on the parabolic approximation for the potential and removes previous limitations. Based on such a solution, a semi-analytical expression for the current is derived. The potential and current models are validated through comparisons with TCAD simulations and are used to evaluate relevant short-channel effect parameters, such as threshold roll-off, drain-induced barrier lowering, and inverse subthreshold slope. The implications of different possible definitions of threshold voltage, either based on the potential in the channel or on a fixed current level, are discussed. Finally, a fully analytical simplification for the current is suggested, which can be used in compact models for circuit simulations.

Published in:

Electron Devices, IEEE Transactions on  (Volume:60 ,  Issue: 4 )

Date of Publication:

April 2013

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