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Modeling particle-induced electron emission in a simplified plasma Test Cell

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2 Author(s)
Giuliano, Paul N. ; Department of Aerospace Engineering, University of Michigan, Ann Arbor, Michigan 48109, USA ; Boyd, Iain D.

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Particle-induced electron emission (PIE) is modeled in a simplified, well-characterized plasma Test Cell operated at UCLA. In order for PIE to be a useful model in this environment, its governing equations are first reduced to lower-order models which can be implemented in a direct simulation Monte Carlo and Particle-in-Cell framework. These reduced-order models are described in full and presented as semi-empirical models. The models are implemented to analyze the interaction of low- and high-energy (∼1–2 keV) xenon ions and atoms with the stainless steel electrodes of the Test Cell in order to gain insight into the emission and transport of secondary electrons. Furthermore, there is a lack of data for xenon-stainless steel atom- and ion-surface interactions for similar environments. Using experimental data as a reference, both total yields and emitted electron energy distribution functions can be deduced by observing sensitivities of current collection results to these numerical models and their parameters.

Published in:

Journal of Applied Physics  (Volume:113 ,  Issue: 11 )