Cart (Loading....) | Create Account
Close category search window
 

Efficient model based halftoning using direct binary search

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Lieberman, D.J. ; Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA ; Allebach, J.P.

The direct binary search (DBS) algorithm is an iterative method which minimizes a metric of error between the grayscale original and halftone image. This is accomplished by adjusting an initial halftone until a local minimum of the metric is achieved at each pixel. The metric incorporates a model for the human visual system (HVS). In general, the DBS time complexity and halftone quality depend on three factors: the HVS model parameters, the choice of initial halftone, and the search strategy used to update the halftone. Despite the complexity of the DBS algorithm, it can be implemented with surprising efficiency. We demonstrate how the algorithm exploits the model for the HVS to efficiently yield very high quality halftones

Published in:

Image Processing, 1997. Proceedings., International Conference on  (Volume:1 )

Date of Conference:

26-29 Oct 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.