By Topic

Performance analysis for mobile-relay-based M2M two-way AF relaying in N*Nakagami-m fading

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Zhang, C. ; State Key Lab. of Integrated Service Networks, Xidian Univ., Xi'an, China ; Ge, J. ; Li, J. ; Hu, Y.

The system outage probability of a mobile-relay-based two-way amplify-and-forward (AF) relaying system is investigated. Independently but not necessarily identically distributed N*Nakagami-m fading is adopted to provide a realistic description of the mobile-to-mobile (M2M) channel. By slightly adjusting the integral region, concise and generalised closed-form lower and upper bounds are obtained, providing valuable insight into practical system designs. Simulation results highlight the derived expressions and show that the lower bound can act as a tight closed-form outage probability expression.

Published in:

Electronics Letters  (Volume:49 ,  Issue: 5 )