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High-resolution and high-sensitivity phase-contrast imaging by focused hard x-ray ptychography with a spatial filter

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6 Author(s)
Takahashi, Yukio ; Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, 2-1 Yamada-oka, Suita, Osaka 565-0871, Japan ; Suzuki, Akihiro ; Furutaku, Shin ; Yamauchi, Kazuto
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Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.4794063 

We demonstrate high-resolution and high-sensitivity x-ray phase-contrast imaging of a weakly scattering extended object by scanning coherent diffractive imaging, i.e., ptychography, using a focused x-ray beam with a spatial filter. We develop the x-ray illumination optics installed with the spatial filter to collect coherent diffraction patterns with a high signal-to-noise ratio. We quantitatively visualize the object with a slight phase shift (∼λ/320) at spatial resolution better than 17 nm in a field of view larger than ∼2×2μm2. The present coherent method has a marked potential for high-resolution and wide-field-of-view observation of weakly scattering objects such as biological soft tissues.

Published in:
Applied Physics Letters  (Volume:102 ,  Issue: 9 )

Date of Publication: Mar 2013

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