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Impact of Power Supply Noise on Clock Jitter in High-Speed DDR Memory Interfaces

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3 Author(s)
Monthie, J. ; LSI, Inc., Milpitas, CA, USA ; Sreekumar, V. ; Yashwante, R.

In this paper we analyze the impact of power supply noise on clock jitter in high-speed DDR memory interfaces. Random system failures on a custom IC were traced to excessive clock jitter on the DDR output clock, which when debugged were attributed to power supply noise caused at certain frequency bands (between ~30 and ~100MHz). We present methods that have been used at the architectural and system levels and in physical design to alleviate the effect of the supply noise on the DDR clock.

Published in:

VLSI Design and 2013 12th International Conference on Embedded Systems (VLSID), 2013 26th International Conference on

Date of Conference:

5-10 Jan. 2013