Cart (Loading....) | Create Account
Close category search window

Adaptive RF Front-end Design via Self-discovery: Using Real-time Data to Optimize Adaptation Control

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Banerjee, D. ; Sch. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA ; Banerjee, A. ; Chatterjee, A.

It has been established in prior research that significant power can be saved by dynamically trading off the performance of individual RF modules for power consumption across changing channel conditions. It has also been shown that the control law that reconfigures the RF front end must take into account the process corners from which the RF devices are selected in order to trade off performance for power in an optimal manner (minimum energy/bit at prescribed data throughput). Design of such an optimal control law is virtually intractable due to the complexity of simulating the RF front end across all possible channel and device process conditions. Hence, existing control algorithms are based on a coarse sampling of the channel-process space, suffer from modeling inaccuracies and are inherently sub-optimal from a performance vs. power perspective. In contrast, in this paper, we propose a RF front end control methodology that is optimized during real-time operation, does not require upfront simulation across all channel process conditions and is not susceptible to simulation inaccuracies. This results in far more robust/optimal control as opposed to current practice. A simulated annealing (SA) based framework for process optimization is proposed along with the use of built-in sensors for monitoring of performance and power. Simulation results and hardware data are presented to show the feasibility of the proposed approach.

Published in:

VLSI Design and 2013 12th International Conference on Embedded Systems (VLSID), 2013 26th International Conference on

Date of Conference:

5-10 Jan. 2013

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.