By Topic

Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $31
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

13 Author(s)
Lee, Che-Hui ; Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA ; Skoromets, Volodymyr ; Biegalski, Michael D. ; Lei, Shiming
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.4793649 

The effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial Sr1+xTiO3+δ films grown on DyScO3 substrates is reported. Direct comparisons between nominally stoichiometric and non-stoichiometric films have been performed through measurements of lattice parameters, temperature-dependent permittivities, second harmonic generation, and terahertz dielectric spectra. The nominally stoichiometric film shows dispersion-free low-frequency permittivity with a sharp maximum and pronounced soft mode behavior. Our results suggest that strained perfectly stoichiometric SrTiO3 films should not show relaxor behavior and that relaxor behavior emerges from defect dipoles that arise from non-stoichiometry in the highly polarizable strained SrTiO3 matrix.

Published in:

Applied Physics Letters  (Volume:102 ,  Issue: 8 )