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Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates

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13 Author(s)
Lee, Che-Hui ; Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA ; Skoromets, Volodymyr ; Biegalski, Michael D. ; Lei, Shiming
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The effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial Sr1+xTiO3+δ films grown on DyScO3 substrates is reported. Direct comparisons between nominally stoichiometric and non-stoichiometric films have been performed through measurements of lattice parameters, temperature-dependent permittivities, second harmonic generation, and terahertz dielectric spectra. The nominally stoichiometric film shows dispersion-free low-frequency permittivity with a sharp maximum and pronounced soft mode behavior. Our results suggest that strained perfectly stoichiometric SrTiO3 films should not show relaxor behavior and that relaxor behavior emerges from defect dipoles that arise from non-stoichiometry in the highly polarizable strained SrTiO3 matrix.

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Applied Physics Letters  (Volume:102 ,  Issue: 8 )