Cart (Loading....) | Create Account
Close category search window

A flexible state-saving library for message-passing systems

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Clematis, A. ; Ist. per la Matematica Applicata, CNR, Genova, Italy ; Deconinck, G. ; Gianuzzi, V.

Message passing applications on a distributed computer require tools to integrate state saving and rollback, to support dynamic program reconfiguration, fault tolerance and others. The paper presents the results of integrating two independently developed tools that combine flexibility and portability. The User-Triggered CheckPointing (UTCP) provides checkpointing and recovery while relying on the programmer to indicate the position of the recovery line and the contents of the checkpoint. The tool PVMsnap provides an extension to PVM to obtain a consistent cut of the message passing application. The combination of both tools results in a portable and flexible solution for fault tolerance which can be adapted to the applications' needs

Published in:

Parallel and Distributed Processing, 1998. PDP '98. Proceedings of the Sixth Euromicro Workshop on

Date of Conference:

21-23 Jan 1998

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.