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Different tips for high-resolution atomic force microscopy and scanning tunneling microscopy of single molecules

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4 Author(s)
Mohn, Fabian ; IBM Research – Zurich, CH-8803 Rüschlikon, Switzerland ; Schuler, Bruno ; Gross, Leo ; Meyer, Gerhard

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We explore different tip functionalizations for atomic force microscopy (AFM), scanning tunneling microscopy (STM), and Kelvin probe force microscopy (KPFM) of organic molecules on thin insulating films. We describe in detail how tips terminated with single Br and Xe atoms can be created. The performance of these tips in AFM, STM, and KPFM imaging of single molecules is compared to other tip terminations, and the advantages and disadvantages of the different tips are discussed. The Br tip was found to be particularly useful for AFM and lateral manipulation, whereas the Xe tip excelled in STM and KPFM.

Published in:

Applied Physics Letters  (Volume:102 ,  Issue: 7 )

Date of Publication:

Feb 2013

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