Cart (Loading....) | Create Account
Close category search window
 

Path delay testing: variable-clock versus rated-clock

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Majumder, S. ; ECE Dept., Rutgers Univ., Piscataway, NJ, USA ; Agrawal, V.D. ; Bushnell, M.L.

There are two methods for applying path delay tests to a sequential circuit. We show that all path delay faults that can affect the rated-clock operation of the circuit are testable by the variable-clock method. Also, all path delay faults that are untestable by the variable-clock method are, in fact, untestable by the rated-clock method. However, some faults tested by the variable-clock method may be incapable of affecting the rated-clock operation. Our study is based on a finite-state machine model in which fault-free transitions are shown by green arcs. Faulty transitions are shown by red arcs. A test traverses successive arcs until a faulty output occurs. A variable-clock test can exercise more flexibility in selecting from green and red arcs. It can cover all functional paths, but may find only a proper subset of untestable paths. Our analysis assumes a delay fault, consisting of either a singly-testable path or multiply-testable paths, and hence corresponds to non-robust detection

Published in:

VLSI Design, 1998. Proceedings., 1998 Eleventh International Conference on

Date of Conference:

4-7 Jan 1998

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.