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Controller resynthesis for testability enhancement of RTL controller/data path circuits

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4 Author(s)
Ravi, S. ; Dept. of Electr. Eng., Princeton Univ., NJ, USA ; Ghosh, I. ; Roy, R.K. ; Dey, S.

In this paper, we propose a controller resynthesis technique to enhance the testability of register-transfer level (RTL) controller/data path circuits. Our technique exploits the fact that the control signals in an RTL implementation are don't cares under certain states/conditions. We make an effective use of the don't care information in the controller specification to improve the overall testability (better fault coverage and shorter test generation time). If the don't care information in the controller specification leaves little scope for respecification, we add control vectors to the controller to enhance the testability. Experimental results with example benchmarks show an average increase in testability of 9% with a 3-4 fold decrease in test generation time for the modified implementation. The area, delay and power overheads incurred for testability are very low. The average area overhead is 0.4%, and the average power overhead is 4.6%. There was no delay overhead due to this technique in most of the cases

Published in:

VLSI Design, 1998. Proceedings., 1998 Eleventh International Conference on

Date of Conference:

4-7 Jan 1998