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Partial scan selection based on dynamic reachability and observability information

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4 Author(s)
Hsiao, M.S. ; Dept. of Electr. & Comput. Eng., Rutgers Univ., Piscataway, NJ, USA ; Saund, G.S. ; Rudnick, E.M. ; Patel, J.H.

A partial scan selection strategy is proposed in which flip-flops are selected via newly proposed dynamic reachability and observability measures such that the remaining hard-to-detect faults are easily detected. This is done by taking advantage of the information available when a target fault is aborted by the test generator. A partial scan selection tool, IDROPS, has been developed which selects the best and smallest set of flip-flops to scan that will result in a high fault coverage. Results indicate that high fault coverage in hard-to-test circuits can be achieved using fewer scan flip-flops than in previous methods

Published in:

VLSI Design, 1998. Proceedings., 1998 Eleventh International Conference on

Date of Conference:

4-7 Jan 1998

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