Cart (Loading....) | Create Account
Close category search window
 

Metrics for the Measurement of the Quality of Stimuli in Radiation Testing Using Fast Hardware Emulation

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Mogollon, J.M. ; Sch. of Eng., Univ. de Sevilla, Sevilla, Spain ; Guzman-Miranda, H. ; Napoles, J. ; Aguirre, M.A.

Radiation Testing of unstructured digital circuits presents an extended set of difficulties related with detection and propagation of the faults to the primary outputs. Stimuli have to be chosen thinking on the possibility of propagating the faults through the logic to the primary outputs. Moreover, the set of stimuli should be selected to enhance the observability of both the time and location of the internal faults.

Published in:

Nuclear Science, IEEE Transactions on  (Volume:60 ,  Issue: 4 )

Date of Publication:

Aug. 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.