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Testing wireless transceivers' RF front-ends utilizing defect-oriented BIST techniques

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4 Author(s)
Dermetzoglou, L. ; Dept. of Inf. & Telecommun., Univ. of Athens, Athens, Greece ; Liaperdos, J. ; Arapoyanni, A. ; Tsiatouhas, Y.

In modern nanotechnologies, the testing of embedded wireless transceivers' RF front-ends is a great concern. The test technique presented in this work is based on dedicated built-in self test (BIST) structures for each building block of the transceiver. These BIST circuits utilize defect-oriented test techniques. Experimental results on a CMOS transceiver design are discussed to accentuate the efficiency of the proposed scheme.

Published in:

Electronics, Circuits and Systems (ICECS), 2012 19th IEEE International Conference on

Date of Conference:

9-12 Dec. 2012

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