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Browse Journals & Magazines > Journal of Applied Physics ...> Volume:113 Issue:6 Help

Local stress determination in chromia-former thanks to micro-Raman spectroscopy: A way to investigate spontaneous delamination processes

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4 Author(s)
Guerain, M. ; Laboratoire des Sciences de l'Ingénieur pour l'Environnement (LaSIE) FRE-CNRS 3474, Université de La Rochelle, Avenue Michel Crépeau 17042 La Rochelle Cedex 1, France ; Goudeau, P. ; Panicaud, B. ; Grosseau-Poussard, J. L.

Your organization might have access to this article on the publisher's site. To check, click on this link:http://dx.doi.org/+10.1063/1.4790308 

Spontaneous delamination process for α-Cr2O3 thermal oxide films growing on NiCr-30 alloys is studied thanks to micro Raman spectroscopy. In particular, stress maps are performed through and around buckles developed on chromia films. Depending on the cooling rate at the end of the oxidation process, different buckle types appear which are investigated. Associated residual stress distribution clearly evidences the stress release field. In addition, geometrical features are determined for the different buckle types, and from comparison with modelling describing buckle formation and propagation, it is possible to get the interface toughness distribution.

Published in:
Journal of Applied Physics  (Volume:113 ,  Issue: 6 )

Date of Publication: Feb 2013

Page(s):
063502 - 063502-7
ISSN :
0021-8979
Digital Object Identifier :
10.1063/1.4790308
Product Type:
Journals & Magazines
Date of Current Version :
14 February 2013
Issue Date :
Feb 2013

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