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Note: Reducing polarization induced sidebands in Rayleigh backscattering spectra for accurate distributed strain measurement using optical frequency-domain reflectometry

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8 Author(s)
Ding, Zhenyang ; College of Precision Instrument and Opto-Electronics Engineering, Tianjin University, Tianjin 300072, China and Key Laboratory of Opto-Electronics Information Technical, Tianjin University, Ministry of Education, Tianjin 300072, China ; Steve Yao, X. ; Liu, Tiegen ; Du, Yang
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We describe a phenomenon called polarization-induced sidebands (PIS) in Rayleigh backscatter spectra (RBS) and discuss its deteriorating effects on the distributed strain measurement using an optical frequency-domain reflectometry. We propose using a special polarization diversity detection scheme to remove PIS and successfully demonstrate accurate distributed strain measurement in the range of 0.75 μɛ–225 μɛ in a 50 m standard single mode fiber, with a good linearity between the strain and the spectra shift in RBS.

Published in:

Review of Scientific Instruments  (Volume:84 ,  Issue: 2 )