Skip to Main Content
A data-base management system has been applied to the management of test results in the development of an integrated-circuit (IC) memory device. The system software is largely independent of the specific device tested and can be applied to any IC device that can be characterized by chips within slices within lots. Several sets of parametric and go-nogo test sequences can be maintained simultaneously. Changes in the tests can be made with no change in the reporting software or the data-base structure. Only one program need be changed when an entry system format is changed.