We are currently experiencing intermittent issues impacting performance. We apologize for the inconvenience.
By Topic

Logic decomposition during technology mapping

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
Lehman, E. ; Digital Equipment Corp., Hudson, MA, USA ; Watanabe, Y. ; Grodstein, J. ; Harkness, H.

A problem in technology mapping is that the quality of the final implementation depends significantly on the initially provided circuit structure. This problem is critical, especially for mapping with tight and complicated constraints. In this paper, we propose a procedure which takes into account a large number of circuit structures during technology mapping. A set of circuit structures is compactly encoded in a single graph, and the procedure dynamically modifies the set during technology mapping by applying simple local transformations to the graph. State-of-the-art technology mapping algorithms are naturally extended, so that the procedure finds an optimal tree implementation over all of the circuit structures examined. We show that the procedure effectively explores the entire solution space obtained by applying algebraic decomposition exhaustively. However, the run time is proportional to the size of the graph, which is typically logarithmic in the number of circuit structures encoded. The procedure has been implemented and used for commercial design projects, We present experimental results on benchmark examples to demonstrate its effectiveness

Published in:

Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on  (Volume:16 ,  Issue: 8 )