Cart (Loading....) | Create Account
Close category search window
 

An extended march test algorithm for embedded memories

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Gang-Min Park ; Dept. of Comput. Sci., Soongsil Univ., Seoul, South Korea ; Hoon Chang

In this paper, an efficient test algorithm and BIST architecture for embedded memories are presented. The proposed test algorithm can fully detect stuck-at fault, transition fault, coupling fault. Moreover, the proposed test algorithm can detect neighborhood pattern sensitive fault, which could not be detected in previous march test algorithms. The proposed test algorithm performs testing for neighborhood pattern sensitive fault using background data, which has been used for word-oriented memory testing

Published in:

Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian

Date of Conference:

17-19 Nov 1997

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.