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Browse Conference Publications > Test Symposium, 1997. (ATS '9 ... Help

TEMPLATES: a test generation procedure for synchronous sequential circuits

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2 Author(s)
Pomeranz, I. ; Dept. of Electr. & Comput. Eng., Iowa Univ., Iowa City, IA, USA ; Reddy, S.M.

We develop the basic definitions and procedures for a test generation concept referred to as templates that magnifies the effectiveness of test generation by taking advantage of the fact that many faults have “similar” test sequences. Once a template is generated, several test sequences to detect different faults are derived from it at a reduced complexity compared to the complexity of test generation

Published in:
Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian

Date of Conference: 17-19 Nov 1997

Page(s):
74 - 79
Meeting Date :
17 Nov 1997-19 Nov 1997
ISSN :
1081-7735
Print ISBN:
0-8186-8209-4
INSPEC Accession Number:
5849164
Conference Location :
Akita
Digital Object Identifier :
10.1109/ATS.1997.643923
Product Type:
Conference Publications

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