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Design of C-testable multipliers based on the modified Booth Algorithm

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3 Author(s)
Boateng, K.O. ; Fac. of Eng., Ehime Univ., Matsuyama, Japan ; Takabashi, H. ; Takamatsu, Y.

In this paper, we consider the design for testability of multipliers based on the modified Booth Algorithm. We introduce two basic array implementations of the multiplier and present a strategy to design for c-testability. Using the proposed strategy we present two designs. The first design, which requires two primary test inputs, is c-testable under the single stuck fault model (SSF) with 17 test vectors. Also under the cell fault model (CFM) we present a design derived from the second implementation. This design, which requires only one primary test input, is c-testable with 34 test vectors and each of its cells can be tested by exhaustively applying cell input patterns

Published in:

Test Symposium, 1997. (ATS '97) Proceedings., Sixth Asian

Date of Conference:

17-19 Nov 1997