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NUMEROUS TECHNIQUES for use in acceptance testing of apparatus have been developed over the past 25 years. It is not possible to cover, because of lack of space, the various devices that may be used in high-voltage laboratories for development work, except in a very general way. At the end of this article, a list of papers most easily accessible to American readers is included. In addition, rather comprehensive bibliographies are available.1–3 There have been many investigators who have made important contributions but are not mentioned because of the necessity for keeping references to a reasonable length.