By Topic

Effects of ruthenium seed layer on the microstructure and spin dynamics of thin permalloy films

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

The purchase and pricing options are temporarily unavailable. Please try again later.
5 Author(s)
Jin, Lichuan ; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, People's Republic of China ; Zhang, Huaiwu ; Tang, Xiaoli ; Bai, Feiming
more authors

Your organization might have access to this article on the publisher's site. To check, click on this link: 

The spin dynamics and microstructure properties of a sputtered 12 nm Ni81Fe19 thin film have been enhanced by the use of a ruthenium seed layer. Both the ferromagnetic resonance field and linewidth are enhanced dramatically as the thickness of ruthenium seed layer is increased. The surface anisotropy energy constant can also be largely tailored from 0.06 to 0.96 erg/cm-2 by changing the seed layer thickness. The changes to the dynamics magnetization properties are caused by both ruthenium seed layer induced changes in the Ni81Fe19 structure properties and surface topography properties. Roughness induced inhomogeneous linewidth broadening is also seen. The damping constant is highly tunable via the ruthenium thickness. This approach can be used to tailor both the structure and spin dynamic properties of thin Ni81Fe19 films over a wide range. And it may benefit the applications of spin dynamics and spin current based devices.

Published in:

Journal of Applied Physics  (Volume:113 ,  Issue: 5 )