Cart (Loading....) | Create Account
Close category search window
 

Extended Component Importance Measures Considering Aleatory and Epistemic Uncertainties

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Sallak, M. ; Comput. Eng. Dept., Compiegne Univ. of Technol., Compiegne, France ; Schon, W. ; Aguirre, F.

We introduce extended component importance measures (Birnbaum importance, RAW, RRW, and Criticality importance) considering aleatory and epistemic uncertainties. The Dempster-Shafer theory, which is considered to be a less restricted extension of probability theory, is proposed as a framework for taking into account both aleatory and epistemic uncertainties. The epistemic uncertainty defined in this paper is the total lack of knowledge of the component state. The objective is to translate this epistemic uncertainty to the epistemic uncertainty of system state, and to the epistemic uncertainty of importance measures of components. Affine arithmetic allows us to provide much tighter bounds in the computing process of interval bounds of importance measures, avoiding the error explosion problem. The efficiency of the proposed measures is demonstrated using a bridge system with different types of reliability data (aleatory uncertainty, epistemic uncertainty, and experts' judgments). The influence of the epistemic uncertainty on the components' rankings is described. Finally, a case study of a fire-detector system located in a production room is provided. A comparison between the proposed measures and the probabilistic importance measures using two-stage Monte Carlo simulations is also made.

Published in:

Reliability, IEEE Transactions on  (Volume:62 ,  Issue: 1 )

Date of Publication:

March 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.