Cart (Loading....) | Create Account
Close category search window
 

Macroscopic Modeling of Magnetization and Levitation of Hard Type-II Superconductors: The Critical-State Model

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Navau, C. ; Dept. de Fis., Univ. Autonoma de Barcelona, Barcelona, Spain ; Del-Valle, N. ; Sanchez, A.

We review the modeling progress of the magnetic response of hard type-II superconductors (SCs) using the critical-state model (CSM). We focus on magnetization loops when a uniform field is applied to the SC and on the levitation forces that appear when the applied field is nonuniform. Different analytical and numerical solutions of the CSM are discussed, and the main characteristics and parameters of the magnetization loops and levitation forces are reviewed. Although this paper does not pretend to be an exhaustive review of the modeling of type-II SCs or of the superconducting levitation studies, a general overview of some important theoretical models used to understand the hard type-II SC macroscopic behavior is presented.

Published in:

Applied Superconductivity, IEEE Transactions on  (Volume:23 ,  Issue: 1 )

Date of Publication:

Feb. 2013

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.