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Fabrication of AlGaN/GaN high electron mobility transistors (HEMTs) on silicon substrate with slant field plates using deep-UV lithography featuring 5W/mm power density at X-band

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5 Author(s)
Chia-Hua Chang ; Department of Material Science and Engineering, National Chiao-Tung University, 1001 Tah-Hsueh Rd., Hsinchu 300, Taiwan, R.O.C. ; Heng-Tung Hsu ; Lu-Che Huang ; Che-Yang Chiang
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In this work, AlGaN/GaN HEMTs on silicon with slant field plate have been successfully fabricated using deep-UV lithography. By using an angle exposure technique, submicron T-shaped gates with slant sidewalls were achieved. The 0.6 × 100μm2 slant-field-plated AlGaN/GaN HEMT on silicon substrate exhibited a peak value of transconductance of 214 mS/mm and a breakdown voltage of 122 V. Through high-frequency measurements, the device revealed a current gain cutoff frequency (fT) of 24 GHz, a maximum oscillation frequency (fmax) of 49 GHz and an output power density of 5.0 W/mm at X-band.

Published in:

2012 Asia Pacific Microwave Conference Proceedings

Date of Conference:

4-7 Dec. 2012